Micrograph Analysis
This covers the examination of the microstructure and layer structure of the individual materials. This technique is crucial for plagiarism detection in multilayer ceramic capacitors (MLCC) and for determining the cause of failure in electronic components, as well as measuring layer thickness.
By creating micrographs, also called microsections, we analyze the microstructure of a material or the structure of different materials in cross-section.
For this purpose, the test specimen is cut into pieces with a precise cut, cast in resin, and cured under UV light to form a cylindrical block. The surface to be examined is then ground to an increasingly smooth finish in several stages and finally polished and, depending on the material, etched if necessary.
The surface of the test specimen is now inspected and assessed under a microscope. A precise measurement is also carried out under the digital microscope to check the thickness of the copper foils of multilayer PCBs, their vias, and the thickness of the solder resist.
At SafeLab, micrograph analysis is often used to examine multilayer ceramic capacitors (MLCCs). Counterfeits of this product category are frequently found as clones in the supply chain. The simply structured surfaces make it almost impossible to recognize plagiarism by external visual inspection. By combining micrograph comparisons (with a reference sample) and electrical tests, counterfeit MLCCs and similar electronic components can be detected. The method is also used to analyze the causes of failure of defective components.
